Quadruple Geological Thin Section Holder Joel Specimen Holders Wewould like to hear your

Wewould like to hear your feedback on how these improvements have affectedyour results

quick and easy to use standalone system

not for Conductive or Tunneling AFM

Also suitable for Zeiss/LEO if they can cope with the longer 9mm pin instead of the standard 6mm pin

Quadruple Geological Thin Section Holder Joel Specimen Holders Wewould like to hear yourDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain